JPH0357940U - - Google Patents

Info

Publication number
JPH0357940U
JPH0357940U JP11827389U JP11827389U JPH0357940U JP H0357940 U JPH0357940 U JP H0357940U JP 11827389 U JP11827389 U JP 11827389U JP 11827389 U JP11827389 U JP 11827389U JP H0357940 U JPH0357940 U JP H0357940U
Authority
JP
Japan
Prior art keywords
cooling tower
coke dry
suction zone
pillars
extinguishing system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11827389U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0650984Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11827389U priority Critical patent/JPH0650984Y2/ja
Publication of JPH0357940U publication Critical patent/JPH0357940U/ja
Application granted granted Critical
Publication of JPH0650984Y2 publication Critical patent/JPH0650984Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP11827389U 1989-10-06 1989-10-06 Ｉｃのテストヘッドとハンドラの結合機構 Expired - Lifetime JPH0650984Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11827389U JPH0650984Y2 (ja) 1989-10-06 1989-10-06 Ｉｃのテストヘッドとハンドラの結合機構

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11827389U JPH0650984Y2 (ja) 1989-10-06 1989-10-06 Ｉｃのテストヘッドとハンドラの結合機構

Publications (2)

Publication Number Publication Date
JPH0357940U true JPH0357940U (en]) 1991-06-05
JPH0650984Y2 JPH0650984Y2 (ja) 1994-12-21

Family

ID=31666450

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11827389U Expired - Lifetime JPH0650984Y2 (ja) 1989-10-06 1989-10-06 Ｉｃのテストヘッドとハンドラの結合機構

Country Status (1)

Country Link
JP (1) JPH0650984Y2 (en])

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007192578A (ja) * 2006-01-17 2007-08-02 Nec Electronics Corp 半導体検査装置
WO2010007652A1 (ja) * 2008-07-14 2010-01-21 株式会社アドバンテスト テストヘッド移動装置及び電子部品試験装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0715241A (ja) * 1993-06-23 1995-01-17 Nec Corp 振幅変調器
JP5858312B1 (ja) * 2014-07-25 2016-02-10 株式会社東京精密 プロービング装置及びプローブコンタクト方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007192578A (ja) * 2006-01-17 2007-08-02 Nec Electronics Corp 半導体検査装置
WO2010007652A1 (ja) * 2008-07-14 2010-01-21 株式会社アドバンテスト テストヘッド移動装置及び電子部品試験装置
TWI393891B (zh) * 2008-07-14 2013-04-21 Advantest Corp Test head moving device and electronic component testing device
JP5226072B2 (ja) * 2008-07-14 2013-07-03 株式会社アドバンテスト テストヘッド移動装置及び電子部品試験装置

Also Published As

Publication number Publication date
JPH0650984Y2 (ja) 1994-12-21

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